The Products

MIR-2000 Family – High Frequency Crystal Blank Sorting System - Automatic crystal blank sorting system with very high frequency measurement capability. The original MIR2000 has been extended to offer higher speed HF measurements and wider frequency range.

MIR-2020 and MIR-2025 – Plated Blank Test Systems – Automatic plated blank test and sort system with (optional) vision assisted base plate carrier identification and position control. System is designed to qualify base plated blanks utilizing the tooling directly from the base plating system.

MIR-2500 and MIR-2500SM – Final Test and Sort System – Automated crystal test and sort system with full parametric test capability at frequencies beyond 1 GHz. Full turnkey operation.

MIR-500T - High Frequency Temperature Test System with frequency range to beyong 1 GHz with improved through put. Utilizing industry standard data warehousing and reporting techniques.

MIR-500B – High Frequency Crystal Measurement System - provides support for making crystal measurements with a variety of network analyzer products. Frequency range is useable up to 1 GHz. Combined with the MIR-1200 Measurement Test Head and an appropriate network analyzer, it provides a very cost effective test and measurement solution.

MIR-500P – High Frequency Crystal Plating and Measurement System Upgrade – provides the MIR-500B test and measurement features as well as very high frequency plating capability. Ideal for upgrading older PI network based plating system to allow engineering or small manufacturing production of high frequency crystals up to 1.3 GHz.

MIR-1200 – Crystal Measurement Test Head – offers a flexible measurement head for characterizing leaded crystal devices. This head is primarily targeted as a reflection measurement head but can also be used as a transmission through type measurement.

MIR-1300 – Crystal Blank Measurement Test Head – provides a unique tool for measuring and characterizing plated crystal blanks before they are mounted. Used with the MIR-500B family of systems, it offers an excellent production or inspection tool for characterizing these devices.