MIR-500P High Frequency Crystal Plating and Measurement System Upgrade

SystemComponents

· MIR-500B High Frequency Crystal Test
Software
· Agilent Network Analyzer
· System Controller Running Windows
- Printer (optional)
· MIR Plating Interface Module
· MIR Frequency Adjustment Software
· Optional Touch Screen Operation

The MIR-500P is a fast method of increasing capacity for measurement and frequency adjustment of crystals at high frequencies. The system is based on the MIR 500B measurement system with capabilties to 1.3 GHz. The system allows older single/dual chamber equipment to be updated for adjusting mesa or high frequency overtone crystals

Key Features

· Wide Frequency Range 1 - 1300 MHz
· Accuracy - Measurement - 2 ppm Fs, Plating - typically 5 ppm or better
· Direct series frequency tracking algorithm
· Measurement capability includes Fs, multiple FL, R, CL, L1, C1, Co, Q and Drive Level measurements
· Programmable Drive Power
· Operator friendly Windows interface for easy operation
· Simple high visibility operating display or real time graphical plating display