MIR-1200 Crystal Measurement Test Head

MIR-1200 - The MIR-1200 is a compact cost effective solution for performing leaded crystal measurements using reflection or transmission device measurements. Coaxial connectors are used with reliable SMA connections.


When coupled with the MIR-500B test and measurement software, it becomes an effective laboratory or production tool for simple and fast characterization of crystal devices at frequencies up to and beyond 1 GHz. Hardened contacts insure a long service life and easy maintenance.

* RANGE: Capable of very wideband measurements - beyond 1 GHz

* MEASUREMENT: Direct Measurement or Load Reactance Measurements

* DIMENSIONS: approx. 1.5 (H) x 2 (W) x 3 (L) ,1.0 LB